Tag Archives QSFP-DD

One of the most significant areas we have seen driving new test and measurement requirements has been data center interconnect – DCI. This rapidly growing area leverages the emergence of pluggable coherent optics (DCO) to allow rapid scaling of data center interconnect bandwidth based on an open, multi-vendor ecosystem. For the DCI market to grow […]

The ONT family has established itself as the reference for module development and validation. This pedigree continues with our ONT-800 family covering both QSFP-DD and CFP2 pluggable digital coherent optics (DCO). Developing and validation of DCO has many new challenges and having a stable test and development environment is key to reliable product validation and […]

With the move to pluggable coherent optical modules for the first time since 10G, we see client and line side considerations coming together. The most obvious example of this is optical signal to noise (OSNR) and related measurements. For any modules with the potential for use in an amplified system, OSNR becomes the fundamental figure […]

Growing up in Castleisland, County Kerry, my family was lucky to know the famous journalist Con Houlihan. With his fantastic command of the written word he was often asked to advise on the progress of young student’s written English by concerned mothers. Con’s stock reply would normally be ‘Well, they are making all the right […]

400G optics have already presented tremendous R&D challenges during the first phases of 400G QSFP-DD development. PAM-4 high speed signalling in both the optical and electrical domains, debugging module firmware and the interaction with the DSP firmware are clear examples, not to mention the new challenge brought about by the latest emerging standard in optical […]

This is the first in a series of blog posts that offer technical and industry insights from Dr. Paul Brooks, who has been involved in R&D and product management for high speed electronic and photonic test equipment for over 20 years. Dr. Brooks holds several patents related to measurement in high speed test equipment and […]

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